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Equipment Features
· Precise numerically controlled combined light source, 10 million-pixel industrial CCD and lens
· The equipment is compact, the system is stable, and the operation is simple. It has supporting experience with printing manufacturers such as Maiwei, Kelongwei, and Jiejiachuang.
· Online detection, seamless connection with production line MES
· Non-contact optical AOI detection can quickly and reliably detect other types of printing abnormalities, and find equipment positioning problems such as stencils or pastes at the first time, avoiding degradation of batch cell printing
· Using multi-level detection result processing conditions, different processing, alarm prompts or shutdown processing can be set for different detection items
Project | Specification |
Applicable Wafer Size | 156*156mm- 170*170mm |
Applicable Wafer Type | Monocrystalline, polycrystalline, diamond wire monocrystalline, polycrystalline, PERC cells |
Maximum capacity | 3800PCS/hour |
Pixel Accuracy | <0.047mm |
Detect defect essence | <0.09mm |
UPTime | >98% |
False positive rate | <1% |
False negative rate | <0.1% |
Equipment Appearance & Installation Diagram
Imaging effect